Thursday, February 04, 201012:30 PM - 2:00 PMT-DO Conference Room (TA-3, Bldg 123, Room 121)|
Lorenzo MacconeMassachusetts Institute of Technology
We point out a general framework that encompasses most cases in which quantum effects enable an increase in precision when estimating a parameter (quantum metrology). The typical quantum precision-enhancement is of the order of the square root of the number of times the system is sampled. We prove that this is optimal and we point out the different strategies (classical and quantum) that permit to attain this bound.
Host: Wojciech Zurek